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dc.contributor.authorShan, Dan-
dc.contributor.authorWang, Menglong-
dc.contributor.authorSun, Daoyuan-
dc.date.accessioned2023-09-15T03:22:28Z-
dc.date.available2023-09-15T03:22:28Z-
dc.date.issued2023-
dc.identifier.urihttps://link.springer.com/article/10.1186/s11671-023-03893-7-
dc.identifier.urihttps://dlib.phenikaa-uni.edu.vn/handle/PNK/9036-
dc.descriptionCC-BYvi
dc.description.abstractVarious doping concentrations of boron (B)-doped germanium nanocrystal (Ge NC) films were prepared using the plasma-enhanced chemical vapor deposition (PECVD) technique followed by thermal annealing treatment. The electronic properties of B-doped Ge NCs films combined with the microstructural characterization were investigated. It is worthwhile mentioning that the Hall mobilities μHall of Ge NCs films were enhanced after B doping and reached to the maximum of 200 cm2 V−1, which could be ascribed to the reduction in surface defects states in the B-doped films. It is also important to highlight that the temperature-dependent mobilities μH(T) exhibited different temperature dependence trends in the Ge NCs films before and after B doping.vi
dc.language.isoenvi
dc.publisherSpringervi
dc.subjectGe NCvi
dc.subjectPECVDvi
dc.titleThe electronic properties of boron-doped germanium nanocrystals filmsvi
dc.typeBookvi
Appears in CollectionsOER - Khoa học Vật liệu, Ứng dụng

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